27 July 2021 Optical frequency-domain reflectometer-based experimental study on lightning strike temperature variation of overhead ground wire
Xin Peng, Zhehao Yan, Jiaqi Wang, Haomao Wang, Zhiguo Zhang, Ye Yan, Jiyong Hou, Xuebin Feng
Author Affiliations +
Funded by: National Natural Science Foundation of China (NSFC)
Abstract
An overhead ground wire is used for both communication and power transmission and is crucial for the long-term operation of power grids. The temperature variations in overhead ground wires under a lightning strike were analyzed using an optical frequency-domain reflectometer. During lightning, the relationship between the peak temperature and the time can be considered a double-exponential distribution. The temperature distribution over time for the overhead ground wire was considered a Gaussian distribution, where the R-squared coefficient was ∼0.95. Moreover, we used the −3  dB bandwidth of the temperature curve at each moment as the lightning temperature influence range for the overhead ground wire. The temperature influence was considered a quadratic function distribution, where the R-squared coefficient was ∼0.98. The characterization of the temperature variation of the lightning struck-overhead ground wire can provide a basis for distributed optical fiber measurement systems to accurately monitor the location and intensity of lightning strikes and can be potentially used to ensure the safety of transmission lines.
© 2021 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2021/$28.00 © 2021 SPIE
Xin Peng, Zhehao Yan, Jiaqi Wang, Haomao Wang, Zhiguo Zhang, Ye Yan, Jiyong Hou, and Xuebin Feng "Optical frequency-domain reflectometer-based experimental study on lightning strike temperature variation of overhead ground wire," Optical Engineering 60(7), 077104 (27 July 2021). https://doi.org/10.1117/1.OE.60.7.077104
Received: 6 April 2021; Accepted: 15 July 2021; Published: 27 July 2021
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KEYWORDS
Temperature metrology

Optical engineering

Optical fibers

Reflectometry

Field programmable gate arrays

Interferometers

Optical testing

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