Mr. João Costa Pinto Profile

João Costa Pinto

at EVOLEO Technologies

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Proceedings Article | 21 August 2024 Poster + Paper

Calibration and test of the Athena on-board metrology system

Manuel Abreu, Alexandre Cabral, José Rebordão, Nuno Gonçalves, Sergio Mottini, João Costa Pinto, Miguel Santos, Davide Oddenino

Proceedings Volume 13093, 130934F (2024) https://doi.org/10.1117/12.3019718

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Athena is ESA’s X-ray observatory mission designed to address the Hot and Energetic Universe theme. The instrument consists of a single x-ray telescope, supported by a large area mirror based on Silicon Pore Optics technology, focusing the photon flux alternatively onto two different instruments: the Wide Field Imager (WFI) and the X-ray Integral Field Unit (X-IFU). The process of switching the focus between the two instruments is produced by a hexapod structure changing the pointing of the main X-ray mirror. To verify that the mirror optical axis is aligned with each of the instruments, an optical On-board Metrology System (OBM) will be used to estimate the telescope pointing with accuracy better than 0.5 arcsec. The OBM system currently in development at the Institute of Astrophysics and Space Sciences is based on the concept of a projective metrology where a pattern of active fiducials is imaged by an array detector. The position and orientation of the imaged pattern provides the necessary information to reconstruct the fiducial displacements with respect to the calibrated reference points, allowing obtaining an estimate of the pointing absolute knowledge error.

The design of the metrology system is presently at Engineering Model level, although it will be tested for performance in normal laboratory conditions.

In this work we will present the experimental setup and processing architecture designed for calibration and testing the OBM demonstrator close to operational conditions, namely in what respects to the distance from the OBM Optical Head to the fiducial plane (12 meter). This experimental setup is calibrated to reproduce verifiable fiducial displacements over the OBM telescope field of view at 7.5 micrometre level (1 sigma). This setup allows evaluating the performance of OBM and verify its compliance with requirements of the on-board metrology system for the Athena X-ray Observatory mission.

Proceedings Article | 31 August 2022 Poster + Paper

Optical on-board metrology in the Athena x-ray mission

Manuel Abreu, Alexandre Cabral, José Manuel Rebordão, Nuno Gonçalves, Sergio Mottini, João Costa Pinto, David Silva, José Afonso, Israel Matute, Davide Oddenino

Proceedings Volume 12181, 1218149 (2022) https://doi.org/10.1117/12.2630023

KEYWORDS: Mirrors, Sensors, Telescopes, Electronics, Metrology, Image sensors, X-rays

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The advanced telescope for high energy astrophysics (Athena) is an ESA X-ray observatory mission to address the hot and energetic universe theme. The instrument consists of a single x-ray telescope, supported by a large area mirror/ lens based on silicon pore optics technology, which will focus the photon flux alternatively onto two different instruments, 12m away: the wide field imager (WFI) and the x-ray integral field unit (X-IFU). The process of switching the focus between the two instruments is produced by a large hexapod structure that is able to change the pointing of the main mirror and the focus plane position, according to strict operational requirements. In order to verify that the mirror optical axis is perfectly aligned with each of the instruments, the telescope shall be supported by an optical on-board metrology system (OBM) that is able to estimate the telescope pointing with accuracy better than 0.5 arcsec.
The Athena OBM system currently under development is based on the concept of a projective metrology where a pattern of active fiducials point sources is imaged onto an array detector. The position and orientation of the imaged pattern provides the necessary information to reconstruct the fiducial displacements with respect to the calibrated reference points, thus allowing obtaining an estimate of the pointing absolute knowledge error. In the present implementation, the fiducials shall be located close to the instrument’s detectors and will be imaged by a specially designed camera system located at the center of the Athena mirror. In this paper we will present the overall architecture and requirements of the metrology system under development for the Athena x-ray observatory mission.

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