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Tobias Schäfer
at Technische Hochschule Aschaffenburg
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Publications (1)
Proceedings Article | 9 September 2019 Paper
X-ray reflectivity measurements at chromium-iridium tri-layer coatings
Veronika Stehlíkova, Thorsten Döhring, Tobias Schäfer, Manfred Stollenwerk, Peter Friedrich, Vadim Burwitz, Gisela Hartner, Miranda Bradshaw, Yingyu Liao, Carlo Pelliciari
Proceedings Volume 11119, 111191L (2019) https://doi.org/10.1117/12.2530439
KEYWORDS: X-rays, Reflectivity, Optical coatings, X-ray astronomy, X-ray telescopes, Iridium, Chromium, Astronomy, Astronomical telescopes, Reflector telescopes
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