Presentation
22 August 2020 Enhanced spontaneous emission of 2D materials on epsilon-near-zero substrates
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Abstract
Photoluminescence enhancement of MoS2 monolayers on TiN thin films grown on sapphire by molecular-beam-epitaxy (MBE) is observed. The PL spectra of MoS2 flakes on MBE-grown 58-nm-thick TiN crystalline film and on reference sapphire substrate are obtained at room temperature using a confocal laser scanning microscope with 405, 445, 488 and 561 nm excitation wavelengths. The maximum PL enhancement for B-exciton (6-fold) and A- trion (15-fold) is obtained at the excitation wavelength 488 nm that matches most closely to the epsilon-near-zero wavelength, 473 nm, of TiN film. A good agreement is observed between measured and calculated enhancements. The enhancement is attributed to increased light absorption when excitation wavelength matches the epsilon-near-zero wavelength of TiN film.
Conference Presentation
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Khant Minn, Aleksei Anopchenko, Ching-Wen Chang, Jinmin Kim, Yu-Jung Lu, Shangjr Gwo, and Ho Wai Howard Lee "Enhanced spontaneous emission of 2D materials on epsilon-near-zero substrates", Proc. SPIE 11462, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVIII, 114620O (22 August 2020); https://doi.org/10.1117/12.2569046
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Tin

Sapphire

Luminescence

Chemical vapor deposition

Confocal microscopy

Crystals

Laser crystals

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