High-resolution phase-sensitive x-ray imaging technique based on the bilens system in an advanced optical layout

M. Sorokovikov; D. Zverev; V. Yunkin; S. Kuznetsov; I. Snigireva; A. Snigirev

doi:10.1117/12.2595017

8 September 2021 High-resolution phase-sensitive x-ray imaging technique based on the bilens system in an advanced optical layout

M. Sorokovikov, D. Zverev, V. Yunkin, S. Kuznetsov, I. Snigireva, A. Snigirev

Author Affiliations +

Proceedings Volume 11839, X-Ray Nanoimaging: Instruments and Methods V; 118390I (2021) https://doi.org/10.1117/12.2595017
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States

Abstract

Recently we demonstrated the phase-sensitive X-ray imaging technique based on the bilens interferometer. The essence of the method consisted of scanning a sample, which was set upstream of the bilens across the beam of one lens of the bilens, and recording changes in the interference pattern. This optical scheme involves fine-tuning the position of the sample on the optical axis, while a small deviation can lead to some distortion of its reconstructed phase profile. In this work, the advanced optical layout is considered. Knowing that the bilens generate two diffraction-limited focal spots, the sample can be placed in the focal plane of the bilens CRLs. In this case, the small size of the focused beams provides excellent phase sensitivity and high spatial resolution allowing to avoid possible distortions of the phase profile completely. The capabilities of both optical schemes were studied theoretically and experimentally.

Conference Presentation

Citation Download Citation

M. Sorokovikov, D. Zverev, V. Yunkin, S. Kuznetsov, I. Snigireva, and A. Snigirev "High-resolution phase-sensitive x-ray imaging technique based on the bilens system in an advanced optical layout", Proc. SPIE 11839, X-Ray Nanoimaging: Instruments and Methods V, 118390I (8 September 2021); https://doi.org/10.1117/12.2595017

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