Dr. Dmitrii Zverev
Researcher at Immanuel Kant Baltic Federal Univ
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 4 October 2022 Paper
Proceedings Volume 12240, 122400I (2022) https://doi.org/10.1117/12.2635493
KEYWORDS: Lenses, Silicon, Interferometers, X-rays, Etching, Metrology, Beam expanders, Scanning electron microscopy, Manufacturing

Proceedings Article | 21 September 2021 Paper
M. Sorokovikov, D. Zverev, V. Yunkin, S. Kuznetsov, I. Snigireva, A. Snigirev
Proceedings Volume 11837, 1183704 (2021) https://doi.org/10.1117/12.2594815
KEYWORDS: Lenses, Silicon, Scanning electron microscopy, Optics manufacturing, X-ray optics, X-rays, Plasma etching, Manufacturing, Etching, Metrology

Proceedings Article | 21 September 2021 Presentation + Paper
Proceedings Volume 11837, 1183702 (2021) https://doi.org/10.1117/12.2594507
KEYWORDS: Axicons, X-rays, X-ray optics, Beam shaping, Commercial off the shelf technology, Imaging systems, Synchrotrons, Scanning electron microscopy

Proceedings Article | 8 September 2021 Presentation + Paper
M. Sorokovikov, D. Zverev, V. Yunkin, S. Kuznetsov, I. Snigireva, A. Snigirev
Proceedings Volume 11839, 118390I (2021) https://doi.org/10.1117/12.2595017
KEYWORDS: Interferometers, X-ray imaging, X-rays, Boron, Tungsten, X-ray optics, Spatial resolution, Phase shifts, Distortion, Interferometry

Proceedings Article | 18 April 2021 Paper
Proceedings Volume 11776, 117760A (2021) https://doi.org/10.1117/12.2589584
KEYWORDS: X-rays, Interferometers, X-ray imaging, Thin films, Reflectivity, Gold, Visible radiation, Synchrotrons, Spatial resolution, Reflectometry

Showing 5 of 11 publications
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