3D x-ray diffraction imaging of optically thin samples

Zachary Gude; Anuj J. Kapadia; Joel A. Greenberg

doi:10.1117/12.2618938

3 June 2022 3D x-ray diffraction imaging of optically thin samples

Zachary Gude, Anuj J. Kapadia, Joel A. Greenberg

Proceedings Volume 12104, Anomaly Detection and Imaging with X-Rays (ADIX) VII; 1210405 (2022) https://doi.org/10.1117/12.2618938
Event: SPIE Defense + Commercial Sensing, 2022, Orlando, Florida, United States

Abstract

Understanding the material composition everywhere in a three-dimensional volume is important for medical, security, and material science applications. Using a fan beam geometry with detector-side coded aperture, we demonstrate fast, high-resolution 3D X-ray diffraction (XRD) imaging. The XRD imaging system has a 15 x 15 cm²field of view with a spatial resolution of approximately 1x1.5x7 mm³ (width x length x depth), a fractional momentum transfer resolution of approximately 10%, and scan times on the order of 10 minutes. Using this system, we show the ability to differentiate between two similar-density organic materials (water and PLA) in 3D using conventional, off-the-shelf components.

Conference Presentation

Citation Download Citation

Zachary Gude, Anuj J. Kapadia, and Joel A. Greenberg "3D x-ray diffraction imaging of optically thin samples", Proc. SPIE 12104, Anomaly Detection and Imaging with X-Rays (ADIX) VII, 1210405 (3 June 2022); https://doi.org/10.1117/12.2618938

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