Reliability challenges of Ge-based photodetectors

Artemisia Tsiara; Solomon Musibau; Kristof Croes

doi:10.1117/12.3002291

8 March 2024 Reliability challenges of Ge-based photodetectors

Artemisia Tsiara, Solomon Musibau, Kristof Croes

Proceedings Volume 12890, Smart Photonic and Optoelectronic Integrated Circuits 2024; 128900F (2024) https://doi.org/10.1117/12.3002291
Event: SPIE OPTO, 2024, San Francisco, California, United States

Abstract

Guaranteeing high signal-to-noise ratio and good optical performance over time of Ge-based photodetectors (PD) is challenging. Encompassing both measurement methodology and understanding the physics of failure. In this paper, we highlight recent developments in this field. Methodology-wise, we present a lifetime-assessment for package-level qualification as well as a wafer-level qualification test, including stress and relaxation study of the degradation. Regarding physics-of-failure, we propose a methodology to differentiate dark current degradation originating from the Ge-bulk, the Ge/SiO₂ interface and the Ge/Si interface.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Artemisia Tsiara, Solomon Musibau, and Kristof Croes "Reliability challenges of Ge-based photodetectors", Proc. SPIE 12890, Smart Photonic and Optoelectronic Integrated Circuits 2024, 128900F (8 March 2024); https://doi.org/10.1117/12.3002291

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available