Paper
3 October 1994 Digital moire applications in automated inspection
Author Affiliations +
Proceedings Volume 2347, Machine Vision Applications, Architectures, and Systems Integration III; (1994) https://doi.org/10.1117/12.188738
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
Machine vision systems routinely utilize structured light techniques for identifying the shapes of defects of the objects under inspection. The basic principle of the method is that any height difference from a reference plane causes a shift in the projection line of light either to left or right and up or down in the image plane of the recording camera. The height difference if due to a defect on an otherwise regular surface will result in a deformed light pattern corresponding to the dimensions of the defect. Moire patterns generated from this deformed light pattern can quantify the defect size, depth and shape. Existing machine vision systems use these techniques for the inspection of flat surfaces. Curved surface inspection although significant remains more or less unexplored. This paper presents the application of a TDI (Time Delay and Integration) camera for defect visualization on curved objects. The TDI operation and some applications of high speed TDI imaging will also be discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anand Krishna Asundi, Sajan R. Marokkey, Gaylord G. Olson, and Jo Norvelle Walker "Digital moire applications in automated inspection", Proc. SPIE 2347, Machine Vision Applications, Architectures, and Systems Integration III, (3 October 1994); https://doi.org/10.1117/12.188738
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CITATIONS
Cited by 9 scholarly publications.
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KEYWORDS
Moire patterns

Inspection

Cameras

Charge-coupled devices

Machine vision

Structured light

Imaging systems

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