Surface inspection using radon transform of projected grating patterns

Krishnakumar Venkateswaran; Anand Krishna Asundi

doi:10.1117/12.447326

30 October 2001 Surface inspection using radon transform of projected grating patterns

Krishnakumar Venkateswaran, Anand Krishna Asundi

Proceedings Volume 4596, Advanced Photonic Sensors and Applications II; (2001) https://doi.org/10.1117/12.447326
Event: International Symposium on Photonics and Applications, 2001, Singapore, Singapore

Abstract

Carrier gratings are generally used to carry the spatial information about surfaces to be inspected and spatial information demodulated using phase shifting methods. Phase shifting methods need more than one image to demodulate the phase information and hence the spatial information of the object. In this paper we propose a method to inspect surfaces by projecting grating patterns on surfaces and Radon transforming the images. Fringe inclination is used as an estimator for locating surface defects.

Citation Download Citation

Krishnakumar Venkateswaran and Anand Krishna Asundi "Surface inspection using radon transform of projected grating patterns", Proc. SPIE 4596, Advanced Photonic Sensors and Applications II, (30 October 2001); https://doi.org/10.1117/12.447326

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