Paper
18 January 1985 Multilayer Dispersion Elements For X-Ray Emission At λ = 17 - 100 Å
S. V. Gaponov, S. A. Gusev, Yu. Ya. Platonov, N. N. Salashchenko
Author Affiliations +
Proceedings Volume 0473, Symposium Optika '84; (1985) https://doi.org/10.1117/12.942451
Event: Symposium Optika '84, 1984, Budapest, Hungary
Abstract
It is shown that near the K edge of absorption of weak absorbers, C, Be and B, using rather light materials, Cd, Ag, Te and Cr, ,it is possible to obtain a reflectivity R ≈ 70 % at spectral resolution λ/Δλ ≈ 50 + 100.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. V. Gaponov, S. A. Gusev, Yu. Ya. Platonov, and N. N. Salashchenko "Multilayer Dispersion Elements For X-Ray Emission At λ = 17 - 100 Å", Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); https://doi.org/10.1117/12.942451
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KEYWORDS
Reflectivity

Mirrors

Multilayers

Spectral resolution

X-rays

Crystals

Silver

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