Paper
19 October 2004 Light interaction with microroughened surfaces based on nuclear microfilters and secondary metallic structures
A. S. Smolyanskii, Boris A. Briskman, V. V. Kolesnikova, O. V. Kolninov, R. M. Lazorenko-Manevich, L. L. Bozadzhiev
Author Affiliations +
Abstract
Optical properties of the modern kinds of nano/microstructure materials - nuclear microfilters (NM) and their metallic replica (so called "needle structures" (NS)) are studied in visible as well as in IR region. The materials are produced from PolyEthylene Terephtalate (PET) film irradiated by accelerated Xe ions as well as by actinoids. The transparence of the ion-irradiated PET films decreases and the reflection increases with the duration of chemical treatment. The interference fringe pattern (IFP) becomes diffuse and weak at the final stages of the etching process. An intense diffraction background (DB) appears in the IR-spectra. A correlation between IFP and DB change and evoked by micropore formation the PET film mass losses is established. DB spectral form can be described by ~λ-2 law at initial stages of the etching and by standard Raleigh law (~λ-4) at the end of the process. The optical properties of the NS prepared from copper and nickel on the base of the same NM are investigated. In both cases development of the surface roughness results in suppression of the "mirror-like" component in the reflected light. A phenomenon of the surface-enhanced IR scattering is discovered for Cu-NS. Possible applications of such nano/microstructure materials in optics are discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. S. Smolyanskii, Boris A. Briskman, V. V. Kolesnikova, O. V. Kolninov, R. M. Lazorenko-Manevich, and L. L. Bozadzhiev "Light interaction with microroughened surfaces based on nuclear microfilters and secondary metallic structures", Proc. SPIE 5512, Plasmonics: Metallic Nanostructures and Their Optical Properties II, (19 October 2004); https://doi.org/10.1117/12.561041
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KEYWORDS
Positron emission tomography

Copper

Polymers

Etching

Ions

Optical properties

Fringe analysis

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