Paper
14 August 2006 A curvature sensor using white-light scanning interferometry
Author Affiliations +
Abstract
We present a method of free-form surface profile measurement using white-light scanning interferometry. This method is based on the principle of curvature sensor which measures the local curvature under test along a line. The profile is then reconstructed from the curvature data on the each point. Unlike subaperture-stiching method and slope detection method curvature sensing have strong points from a geometric point of view in measuring the free-form surface profile. Curvature is related to second derivative terms of surface profile and an intrinsic property of the test piece, which is independent of its position and tip-tilt motion. The curvature is measured at every local area with high accuracy and high lateral resolution by using White-light scanning interferometry.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
ByoungChang Kim, SeHeon Kim, YongKwan Kwon, YunWoo Lee, HoSoon Yang, and HyugGyo Rhee "A curvature sensor using white-light scanning interferometry", Proc. SPIE 6292, Interferometry XIII: Techniques and Analysis, 629219 (14 August 2006); https://doi.org/10.1117/12.675925
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Interferometers

Wavefronts

Interferometry

Distance measurement

Objectives

Aspheric lenses

Back to Top