Electronic speckle pattern interferometry technique for the measurement of complex mechanical structures for aero-spatial applications

René Restrepo; Néstor Uribe-Patarroyo; Daniel Garranzo; José M. Pintado; Malte Frovel; Tomás Belenguer

doi:10.1117/12.870673

13 September 2010 Electronic speckle pattern interferometry technique for the measurement of complex mechanical structures for aero-spatial applications

René Restrepo, Néstor Uribe-Patarroyo, Daniel Garranzo, José M. Pintado, Malte Frovel, Tomás Belenguer

Author Affiliations +

Proceedings Volume 7387, Speckle 2010: Optical Metrology; 73871B (2010) https://doi.org/10.1117/12.870673
Event: Speckle 2010, 2010, Florianapolis, Brazil

Abstract

Using the electronic speckle pattern interferometry (ESPI) technique in the in-plane arrangement, the coefficient of thermal expansion (CTE) of a composite material that will be used in a passive focusing mechanism of an aerospace mission was measured. This measurement with ESPI was compared with another interferometric method (Differential Interferometer), whose principal characteristic is its high accuracy, but the measurement is only local. As a final step, the results have been used to provide feedback with the finite element analysis (FEA). Before the composite material measurements, a quality assessment of the technique was carried out measuring the CTE of Aluminum 6061-T6. Both techniques were compared with the datasheet delivered by the supplier. A review of the basic concepts was done, especially with regards to ESPI, and the considerations to predict the quality in the fringes formation were explained. Also, a review of the basic concepts for the mechanical calculation in composite materials was done. The CTE of the composite material found was 4.69X10^-6 ± 3X10^-6K^-1. The most important advantage between ESPI and differential interferometry is that ESPI provides more information due to its intrinsic extended area, surface deformation reconstruction, in comparison with the strictly local measurement of differential interferometry

Citation Download Citation

René Restrepo, Néstor Uribe-Patarroyo, Daniel Garranzo, José M. Pintado, Malte Frovel, and Tomás Belenguer "Electronic speckle pattern interferometry technique for the measurement of complex mechanical structures for aero-spatial applications", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73871B (13 September 2010); https://doi.org/10.1117/12.870673

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available