Paper
22 June 2013 Three-dimensional shape measurement with wavelength-modulated laser base on fiber optic interferometer projection
Author Affiliations +
Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 876938 (2013) https://doi.org/10.1117/12.2018935
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
A novel three dimensional profilometry technique by optical fiber interference projection was presented. Take the wavelength-modulated laser as the light source to make the purpose of interference fringe phase-shift by changing the wavelength of the precision power. Compare with the traditional means what changing the phase by PZT, the new method is easier in phase calibration and phase-shift controlling for its anti-interference and having no hysteresis. In addition, the experimental equipment can be associated with commercial interferometer so that their software can be taken as the tool for data processing.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ronggang Zhu, Qian Song, Rihong Zhu, and Jianxin Li "Three-dimensional shape measurement with wavelength-modulated laser base on fiber optic interferometer projection", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 876938 (22 June 2013); https://doi.org/10.1117/12.2018935
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KEYWORDS
Interferometers

Phase shifts

Calibration

Fiber optics

3D metrology

Phase measurement

Fiber lasers

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