Presentation
13 March 2024 Narrowband ns and ps laser sources for the wide infrared spectral range based on nonlinear light conversion
Author Affiliations +
Abstract
Widely tunable narrowband mid-infrared coherent sources, realized using optical parametric oscillators, play an essential role in spectroscopic investigations. A part of mid-infrared spectral region is a “fingerprint range” of solid-state materials, therefore, narrow linewidth is a particularly important feature. The most suitable linewidth of radiation to satisfy the required resolution for spectroscopy of solids is 2‒6 cm-1. The biggest challenge for the developer of the laser source is meeting customers’ needs and providing numerous parameters simultaneously from a single device: broad spectral range, high spectral resolution, fast wavelength tuning, high repetition rate, stable beam direction, nearly diffraction-limited divergence, etc. All this should be provided throughout the entire operational spectral range. These features are relevant for many applications, especially for Scanning Near-field Optical Microscopy (SNOM). This presentation will describe the architecture and applications of EKSPLA's broadly tunable commercial ns and ps laser sources, from 2 to 18 μm based on OP-GaAs fan-type gratings and other mid-infrared OPO nonlinear crystals. The advantages and limitations of the crystals in different narrowband OPO setups will be presented.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Regimantas Januškevičius, Romaldas Antanavičius, Aleksandr Alesenkov, Tomas Kašponas, Mikhail Grishin, Virginija Petrauskienė, Andrejus Michailovas, Robertas Kananavičius, Julius Lukošiūnas, and Rokas Danilevičius "Narrowband ns and ps laser sources for the wide infrared spectral range based on nonlinear light conversion", Proc. SPIE PC12869, Nonlinear Frequency Generation and Conversion: Materials and Devices XXIII, PC128690E (13 March 2024); https://doi.org/10.1117/12.3011267
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KEYWORDS
Picosecond phenomena

Infrared radiation

Mid-IR

Near field scanning optical microscopy

Optical parametric oscillators

Industrial applications

Spectral resolution

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