Abhishek Tiwari
at Samsung R&D Institute India - Bangalore
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 March 2018 Presentation + Paper
Abhishek Tiwari, Kedar Anil Patwardhan
Proceedings Volume 10574, 1057419 (2018) https://doi.org/10.1117/12.2293083
KEYWORDS: Feature extraction, Computed tomography, 3D image processing, Medical imaging, Ultrasonography, 3D scanning, Pattern recognition, Object recognition

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