Prof. Adrian Biland Profile

Prof. Adrian Biland

at ETH Zurich

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 26 August 2022 Presentation + Paper

First measurements and upgrade plans of the MAGIC intensity interferometer

Juan Cortina, V. Acciari, A. Biland, E. Colombo, C. da Costa, C. Delgado, C. Díaz, M. Fiori, D. Fink, T. Hassan, I. Jiménez-Martínez, E. Lyard, M. Mariotti, G. Martínez, R. Mirzoyan, G. Naletto, M. Polo, N. Produit, J. Rodríguez, T. Schweizer, R. Walter, C. Wunderlich, L. Zampieri

Proceedings Volume 12183, 121830C (2022) https://doi.org/10.1117/12.2629876

KEYWORDS: Telescopes, Stars, Interferometers, Mirrors, Optical correlators, Digital signal processing, Cameras, Optical filters, Interferometry, Atmospheric Cherenkov telescopes

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Proceedings Article | 10 August 2016 Paper

Bokeh mirror alignment for Cherenkov telescopes

S. Mueller, J. Adam, M. Ahnen, D. Baack, M. Balbo, M. Bergmann, A. Biland, M. Blank, T. Bretz, K. Bruegge, J. Buss, A. Dmytriiev, D. Dorner, S. Einecke, C. Hempfling, D. Hildebrand, G. Hughes, L. Linhoff, K. Mannheim, D. Neise, A. Neronov, M. Noethe, A. Paravac, F. Pauss, W. Rhode, A. Shukla, F. Temme, J. Thaele, R. Walter

Proceedings Volume 9908, 99084O (2016) https://doi.org/10.1117/12.2232561

KEYWORDS: Mirrors, Image segmentation, Atmospheric Cherenkov telescopes, Telescopes, Image sensors, Lamps, Lanthanum, Point spread functions, Prototyping, Gamma radiation

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Proceedings Article | 27 July 2016 Paper

FACT: status and experience from four years of operation of the first G-APD Cherenkov Telescope

A. Biland, J. Adam, M. Ahnen, D. Baack, M. Balbo, M. Bergmann, M. Blank, T. Bretz, K. Brügge, J. Buss, A. Dmytriiev, D. Dorner, S. Einecke, C. Hempfling, D. Hildebrand, G. Hughes, L. Linhoff, K. Mannheim, S. Müller, D. Neise, A. Neronov, M. Nöthe, A. Paravac, F. Pauss, W. Rhode, A. Shukla, F. Temme, J. Thaele, R. Walter

Proceedings Volume 9906, 99061A (2016) https://doi.org/10.1117/12.2232600

KEYWORDS: Atmospheric Cherenkov telescopes, Telescopes, Cameras, Atmospheric particles, Electronics, Sensors, Calibration, Temperature metrology, Physics, Telecommunications

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