Dr. Aiko K. Ruprecht Profile

Dr. Aiko K. Ruprecht

Manager Advanced Development at Trioptics GmbH

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Author

Publications (12)

Proceedings Article | 8 March 2014 Paper

Measuring the refractive index with precision goniometers: a comparative study

Stefan Krey, Dennis Off, Aiko Ruprecht

Proceedings Volume 8992, 89920D (2014) https://doi.org/10.1117/12.2041760

KEYWORDS: Prisms, Refractive index, Telescopes, Autocollimation, Spectroscopy, Autocollimators, Glasses, Error analysis, Collimators, Lamps

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Proceedings Article | 19 September 2013 Paper

Highly accurate measurement of lens surface distances within optical assemblies for quality testing

P. Langehanenberg, A. Ruprecht, D. Off, B. Lueerss

Proceedings Volume 8844, 88440F (2013) https://doi.org/10.1117/12.2024157

KEYWORDS: Interferometers, Optics manufacturing, Interferometry, Mirrors, Optical fabrication, Optical components, Light sources, Refractive index, Sensors, Modulation

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Proceedings Article | 15 February 2011 Paper

Automated measurement of centering errors and relative surface distances for the optimized assembly of micro-optics

Patrik Langehanenberg, Eugen Dumitrescu, Josef Heinisch, Stefan Krey, Aiko Ruprecht

Proceedings Volume 7926, 79260E (2011) https://doi.org/10.1117/12.874628

KEYWORDS: Interferometers, Imaging systems, Autocollimators, Error analysis, Objectives, Optical components, Cell phones, Optical alignment, Optics manufacturing, Refractive index

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Proceedings Article | 14 May 2010 Paper

Simple methods for alignment of line distance sensor arrays

H. Bremer, F. Schmähling, C. Elster, S. Krey, A. Ruprecht, M. Schulz, M. Stavridis, A. Wiegmann

Proceedings Volume 7718, 77181M (2010) https://doi.org/10.1117/12.854266

KEYWORDS: Sensors, CCD image sensors, Distance measurement, CCD cameras, Optical arrays, Colorimetry, Microscopes, Charge-coupled devices, Optical sensors, Distortion

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Proceedings Article | 29 August 2008 Paper

High resolution wavefront measurement of aspheric optics

I. Erichsen, S. Krey, J. Heinisch, A. Ruprecht, E. Dumitrescu

Proceedings Volume 7060, 70600T (2008) https://doi.org/10.1117/12.794467

KEYWORDS: Wavefronts, Semiconducting wafers, Wavefront sensors, Sensors, Light sources, Optical testing, Modulation transfer functions, Wafer-level optics, Aspheric optics, Aspheric lenses

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Proceedings Article | 25 April 2008 Paper

Ultra-fast wavefront analyser for high volume production of camera modules lenses

M. Cherrier, I. Erichsen, A. Ruprecht, S. Krey

Proceedings Volume 6995, 699512 (2008) https://doi.org/10.1117/12.781433

KEYWORDS: Semiconducting wafers, Wavefronts, Lenses, Sensors, Wavefront sensors, Objectives, Telescopes, Light sources, Microscopes, Modulation transfer functions

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Proceedings Article | 14 May 2007 Paper

Aspheric lens tester with shack-hartmann sensor

A. Ruprecht, I. Scheele, S. Krey, J. Heinisch

Proceedings Volume 10316, 103160W (2007) https://doi.org/10.1117/12.719736

KEYWORDS: Wavefronts, Sensors, Aspheric lenses, Wavefront sensors, Imaging systems, Modulation transfer functions, Image sensors, Point spread functions, Microlens array, Cameras

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Proceedings Article | 13 June 2005 Paper

Confocal micro-optical distance sensor: realization and results

Peter Lucke, Arndt Last, Jurgen Mohr, Aiko Ruprecht, Christof Pruss, Hans Tiziani, Wolfgang Osten, Peter Lehmann, Sven Schonfelder

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612418

KEYWORDS: Sensors, Confocal microscopy, Head, Light sources, Signal detection, Diffractive optical elements, Colorimetry, Optical components, Polymethylmethacrylate, Optical alignment

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Proceedings Article | 13 June 2005 Paper

Confocal micro-optical distance sensor: principle and design

Aiko Ruprecht, Christof Pruss, Hans Tiziani, Wolfgang Osten, Peter Lucke, Arndt Last, Jurgen Mohr, Peter Lehmann

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612008

KEYWORDS: Sensors, Confocal microscopy, Colorimetry, Head, Ray tracing, Optical components, Optical design, Fiber optics sensors, Diffraction, Mirrors

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Proceedings Article | 10 September 2004 Paper

New approaches in depth-scanning optical metrology

Klaus Korner, Aiko Ruprecht, Tobias Wiesendanger

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.554754

KEYWORDS: Confocal microscopy, Sensors, Colorimetry, Laser welding, Light sources, Beam splitters, Spectroscopy, Objectives, Cameras, Optical metrology

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Proceedings Article | 1 September 2004 Paper

Confocal micro-optical distance sensor for precision metrology

Peter Luecke, Arndt Last, Juergen Mohr, Aiko Ruprecht, Wolfgang Osten, Hans Tiziani, Peter Lehmann

Proceedings Volume 5459, (2004) https://doi.org/10.1117/12.545404

KEYWORDS: Sensors, Head, Confocal microscopy, Diffractive optical elements, Metrology, Tolerancing, Optical components, Optical alignment, Quartz, Zemax

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Proceedings Article | 16 April 2004 Paper

Chromatic confocal detection for high-speed microtopography measurements

Aiko Ruprecht, Klaus Koerner, Tobias Wiesendanger, Hans Tiziani, Wolfgang Osten

Proceedings Volume 5302, (2004) https://doi.org/10.1117/12.525658

KEYWORDS: Confocal microscopy, Colorimetry, Sensors, Spectroscopy, Microscopes, Microlens, Optical design, Collimation, Time metrology, Stray light

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Showing 5 of 12 publications

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