KEYWORDS: Particle accelerators, Microelectronics, Data acquisition, Control systems, Analog electronics, Free electron lasers, Data processing, Superconductors, Software development, Computing systems
Department of Microelectronics and Computer Science of Lodz University of Technology has long traditions and high expertise in field of design of electronic systems of various kinds and for several applications. DMCS has expertise in design of PCB (Printed Circuit Board) based and ASIC (Application Specific Integrated Circuit) based analog, mixed-signal and digital system designs. DMCS design teams participated in numerous national and international scientific research programs and grants. A series of commercial contracts was also conducted in DMCS. Many of these works finished with introduction of new systems into scientific installations or putting new product into general markets. Several DMCS achievements have been successfully patented. Such extensive experience in connection with wide field of scientific activities, enabled application of DMCS capabilities to quite different and even unusual electronic system applications aimed at work in extreme environments.
The behavioral and circuit equivalent models applied to silicon carbide semiconductor power devices have been
presented. The MOSFET and Merged PiN Schottky diode (MPS) including dynamic electro-thermal modeling have been
described in details. The authors also show the problems of the active power estimation for dynamic SiC MPS diode and
unrealistic results for manufacturer-provided models.
Today, power semiconductor devices enable sustaining several kilovolts and kiloamperes. New structures are constantly
being developed for almost every particular device type. However, below the advanced technological concepts, proper
design still relies on a few simple rules that result from physical operating principles and limits of semiconductor
structures.
Reliability of new, advanced electronic systems becomes a serious problem especially in places like accelerators
and synchrotrons, where sophisticated digital devices operate closely to radiation sources. One of the possible
solutions to harden the microprocessor-based system is a strict programming approach known as the Software
Implemented Hardware Fault Tolerance. Unfortunately, in real environments it is not possible to perform precise
and accurate tests of the new algorithms due to hardware limitation. This paper highlights the AVR-family
microcontroller simulator project equipped with an appropriate monitoring and the SEU injection systems.
Stability and precision of signal controlling particle accelerator is very complex problem. Most sophisticated
analog design of vector modulator sometimes cannot provide signal with satisfying parameters. This paper
present possible future solution using less components than analog vector modulator. There are described two
options, one is digital vector modulation with analog upconversion and second one is full digital synthesis.
Bremsstrahlung gamma radiation and neutrons are produced during the operation of high-energy linear accelerators. A single circular tunnel is built for the X-ray Free Electron Laser (X-FEL), therefore most of electronic devices used to control the machine are going to be placed in the same vault as the main beam pipe. Therefore, the devices will be subjected to neutron and gamma radiation influence. Knowledge of neutron and gamma doses are crucial to understand and interpret radiation effects on electronic devices and systems dedicated to the operation in the environment of high-energy linear accelerators. Indeed, it is advisable to monitor radiation produced in the tunnel of X-FEL in real time to estimate the danger and the life-time of electronic components and devices. The realtime monitoring system dedicated to measure radiation produced in a linear accelerator tunnel was designed. The system utilizes two different types of detectors to gauge neutron fluence and gamma radiation dose during the operation of the accelerator driving X-FEL. Research described in this paper is focused on real time gamma radiation dosimetry. Silicon-based gamma-sensitive dosimeter RadFET was employed to quantify radiation produced during an operation of a linear accelerator. In order to fully investigate the feasibility of RadFET detector for gamma dosimetry various experiments and gamma radiation exposure tests were carried out using a cesium source and inside FLASH (Free Electron Laser At Hamburg) facility placed in a high-energy Research Centre DESY.
KEYWORDS: Field programmable gate arrays, Particles, Logic, Clocks, Transistors, Digital libraries, Commercial off the shelf technology, Radiation effects, Control systems design, Electronic components
This paper presents a new cost-effective method of designing Single Event Upset (SEU)-tolerant digital systems based on Commercial-Off-The-Shelf (COTS) Field-Programmable-Gate-Array (FPGA) devices. The project was carried out in cooperation of Technical University of Lodz (TUL) with Deutsches Elektronen-Synchrotron (DESY). DESY is a high-energy particle physics research centre, located in Hamburg, Germany, and has been chosen as a home site for a new generation particle collider - X-Ray Free Electron Laser (X-FEL) accelerator. A need of implementing digital control systems inside accelerators main tunnel, brought a new hardware approach to low-cost design reliable compex circuits with respect to Single Event Effects (SEEs). The goal was to develop a high performance method without modifications in the FPGA architecture and without high area penalties. A SEU-tolerant, digital library has been created. From basic gates, through combinational and sequential cells to some more sophisticated units like memory blocks, code converters or arithmetical functions cells, in all elements upset detection and mitigation schemes have been implemented. The library was described in Very High Speed Integrated Circuit Hardware Description Language (VHDL).
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.