Anna Metleva
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 June 2021 Poster + Paper
Proceedings Volume 11783, 117830O (2021) https://doi.org/10.1117/12.2592259
KEYWORDS: Electron beams, Oxides, Niobium, Control systems, Statistical analysis, Optics manufacturing, Optical filters, Interference filters, Analytical research, X-rays

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