Bernd Kagerer
Dir. of Technical Mkt. at NanoFocus AG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 June 2002 Paper
Bernd Kagerer, Rainer Brodmann, Juergen Valentin, Jan Filzek, Uwe Popp
Proceedings Volume 4773, (2002) https://doi.org/10.1117/12.469201
KEYWORDS: Confocal microscopy, Microscopes, Sensors, Metals, Objectives, 3D metrology, Microscopy, Interferometry, Standards development, Radium

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