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Dr. Brian W. Yates
Staff Scientist at Canadian Light Source Inc
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 9 September 2019 Presentation + Paper
EUV Stokes reflection polarimeter using gold coated mirrors for use up to 150 eV photon energy
Proceedings Volume 11109, 111090G (2019) https://doi.org/10.1117/12.2528826
KEYWORDS: Polarization, Gold, Reflectivity, Polarimetry, Mirrors, Wave plates, Photon polarization
Proceedings Article | 15 October 2012 Paper
Using MountainsMap (Digital Surf) surface analysis software as an analysis tool for x-ray mirror optical metrology data
Alan Duffy, Brian Yates, Peter Takacs
Proceedings Volume 8501, 850106 (2012) https://doi.org/10.1117/12.931646
KEYWORDS: MATLAB, Mirrors, Metrology, Standards development, X-rays, Surface roughness, Optical metrology, X-ray optics, 3D metrology, Error analysis
Proceedings Article | 23 September 2011 Paper
Using MapleSim to model a six-strut kinematic mount for aligning optical components
Alan Duffy, Brian Yates, Yongfeng Hu
Proceedings Volume 8141, 81410Q (2011) https://doi.org/10.1117/12.894147
KEYWORDS: Mirrors, Kinematics, Solid modeling, Motion models, 3D modeling, Optical components, Ray tracing, Systems modeling, Mirror mounts, Computer aided design
Proceedings Article | 27 August 2010 Paper
Improved synchrotron performance from indium antimonide crystals
Brian Yates, Yongfeng Hu, Vinay Nagarkal
Proceedings Volume 7802, 78020U (2010) https://doi.org/10.1117/12.859706
KEYWORDS: Crystals, Indium, Laser crystals, Photonic crystals, Finite element methods, Silicon, Synchrotrons, Interfaces, Monochromators, Mirrors
Proceedings Article | 3 September 2008 Paper
Statistical analysis of the metrological properties of float glass
Brian Yates, Alan Duffy
Proceedings Volume 7077, 70770D (2008) https://doi.org/10.1117/12.795278
KEYWORDS: Tin, Glasses, Surface roughness, Statistical analysis, Spatial frequencies, Profilometers, Mirrors, Error analysis, Metrology, Ultraviolet radiation
Conference Committee Involvement (23)
Advances in X-Ray/EUV Optics and Components XVII
22 August 2022 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XVI
2 August 2021 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XV
26 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in X-Ray/EUV Optics and Components XIV
14 August 2019 | San Diego, California, United States
Showing 5 of 23 Conference Committees
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