Byeongkyu Cha
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Presentation + Paper
Dongok Kim, Wonhee Lee, Yeny Yim, Byeongkyu Cha, Hansaem Park, Subong Shon, Myungjun Lee
Proceedings Volume 12955, 129550Y (2024) https://doi.org/10.1117/12.3009407
KEYWORDS: Image segmentation, Transmission electron microscopy, Image processing, Metrology, Electron microscopes, Active learning

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