We examine the effects on the spatial and angular Goos-Hanchen (GH) beam shifts of spherical and cylindrical pores in a thin film. In our calculations, a p-polarized light is incident on a 1-μm thick porous silicon (Si) thin film on a Si substrate. The beam shifts are within the measurement range of usual optical detectors. Our results show that a technique based on GH shift can be used to determine the porosity and pore structure of thin films at a given thickness.
Pulsed laser deposition of BiSrCaCuO on MgO (100) using Q-switched Nd:YAG nanosecond laser operating at λ= 1064 nm (ns-PLD) and mode-locked Ti:Sa femtosecond laser at λ= 785 nm (fs-PLD) were performed. Rough surface with spheriodal morphology is the general microstructure of the deposited material from both nanosecond and femtosecond laser ablation. Femtosecond PLD resulted to granular morphology containing both BSCCO phase and rod-like Cu2O grains. Unlike ns-PLD, fs-PLD produced polycrystalline films even without heat treatment. These results indicate that two distinct ablation characteristic for ns-PLD and fs-PLD of BSCCO.
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