Chun-Chao Tsui
at National Taiwan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 September 2011 Paper
Proceedings Volume 8155, 815519 (2011) https://doi.org/10.1117/12.893211
KEYWORDS: Polymethylmethacrylate, Fresnel lenses, Silicon, Infrared lenses, Infrared radiation, Signal detection, Refractive index, Thermography, Semiconducting wafers, Coating

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