Dr. Daniel Staaks Profile

Dr. Daniel Staaks

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 13 March 2018 Presentation + Paper

G. Freychet, D. Kumar, R. Pandolfi, D. Staacks, P. Naulleau, R. J. Kline, D. Sunday , M. Fukuto, J. Strzalka, A. Hexemer

Proceedings Volume 10585, 1058512 (2018) https://doi.org/10.1117/12.2297518

KEYWORDS: X-rays, Scattering, Metrology, Grazing incidence, Nanostructures, Genetic algorithms

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Keywords/Phrases