David E. Perkins
at Univ of Wales
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 May 2004 Paper
Proceedings Volume 5468, (2004) https://doi.org/10.1117/12.544015
KEYWORDS: Semiconductor lasers, Reflectivity, Mirrors, Refractive index, Dielectrics, Laser optics, Inspection, Fractal analysis, Lasers, Reflectors

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