David Stoddart
at Univ of Sheffield
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 June 2024 Poster + Paper
Proceedings Volume 12997, 129971M (2024) https://doi.org/10.1117/12.3023668
KEYWORDS: Measurement uncertainty, Metrology, Manufacturing, Inspection, Calibration, Tolerancing

SPIE Journal Paper | 26 April 2017
Feng Li, David Stoddart, Carl Hitchens
OE, Vol. 56, Issue 04, 044107, (April 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.4.044107
KEYWORDS: Clouds, Principal component analysis, Image registration, 3D modeling, Matrices, Optical engineering, Optical scanning, Cameras, Lithium, Manufacturing

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