Dr. Ersin Kayahan
Researcher at Kocaeli Univ
SPIE Involvement:
Author
Area of Expertise:
optical surface roughnes , bio/chemical sensors , optical properties of thin films , porous silicon , Z-Scan technique
Websites:
Publications (1)

Proceedings Article | 4 November 2003 Paper
Proceedings Volume 5226, (2003) https://doi.org/10.1117/12.519491
KEYWORDS: Picosecond phenomena, Silicon, Luminescence, FT-IR spectroscopy, Absorption, Semiconducting wafers, Visible radiation, Ultraviolet radiation, Quantum electronics, Oxidation

Conference Committee Involvement (2)
APMAS 2013
24 April 2013 |
APMAS 2012
26 April 2012 |
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