Dr. Feng Yi Profile

Dr. Feng Yi

at National Institute of Standards and Technology

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 5 October 2023 Presentation

Nanoscale mass measurement using laser doppler vibrometry for nanocalorimetry studies of semiconductor materials

Lakshmi Ravi Narayan, Feng Yi, Isak McGieson, William Alexander Osborn, David LaVan

Proceedings Volume 12672, 1267204 (2023) https://doi.org/10.1117/12.2675336

KEYWORDS: Vibrometry, Sensors, Semiconductor materials, Doppler effect, Semiconductor lasers, Vibration, Statistical analysis, Platinum, Materials properties, Thin films

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years