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Grzegorz Wielgoszewski
PhD Student at Wroclaw Univ of Technology
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Publications (1)
Proceedings Article | 25 July 2013 Paper
Silicon nanowires reliability and robustness investigation using AFM-based techniques
Tomasz Bieniek, Grzegorz Janczyk, Paweł Janus, Piotr Grabiec, Marek Nieprzecki, Grzegorz Wielgoszewski, Magdalena Moczała, Teodor Gotszalk, Elizabeth Buitrago, Montserrat Badia, Adrian Ionescu
Proceedings Volume 8902, 89022L (2013) https://doi.org/10.1117/12.2031229
KEYWORDS: Atomic force microscopy, Silicon, Reliability, Scanning electron microscopy, Biosensing, Nanostructures, Nanolithography, Field effect transistors, Sensing systems, Nanowires
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