Dr. Huddee J. Ho
at FortéBio Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 September 1998 Paper
Proceedings Volume 3512, (1998) https://doi.org/10.1117/12.324048
KEYWORDS: Contamination, Atomic force microscopy, Capillaries, Image resolution, Molecules, Coating, Nondestructive evaluation, Feedback signals, Energy transfer, Glasses

Proceedings Article | 7 July 1997 Paper
Michael Postek, Huddee Ho, Harrison Weese
Proceedings Volume 3050, (1997) https://doi.org/10.1117/12.275914
KEYWORDS: Scanning electron microscopy, Standards development, Atomic force microscopy, Scanning tunneling microscopy, Metrology, Dimensional metrology, Microscopes, Photomicroscopy, Electron microscopes, Microscopy

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