Dr. Imelda P. Keen
Research Fellow at Univ of Queensland
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 21 March 2012 Paper
Proceedings Volume 8323, 83231O (2012) https://doi.org/10.1117/12.916744
KEYWORDS: Line edge roughness, Extreme ultraviolet lithography, Picosecond phenomena, Polymers, Lithography, Directed self assembly, Photoresist materials, Etching, Glasses, Reactive ion etching

Proceedings Article | 4 April 2011 Paper
Proceedings Volume 7970, 79701V (2011) https://doi.org/10.1117/12.881491
KEYWORDS: Electron beam lithography, Annealing, Double patterning technology, Extreme ultraviolet, Line edge roughness, Electron beams, Directed self assembly, Scanning electron microscopy, Extreme ultraviolet lithography, Photoresist materials

Proceedings Article | 31 October 2001 Paper
Peter Fredericks, Imelda Keen, Llewellyn Rintoul
Proceedings Volume 4469, (2001) https://doi.org/10.1117/12.447372
KEYWORDS: Raman spectroscopy, Plasma treatment, Polymers, Crystals, Picosecond phenomena, Plasma, Oxygen, Particles, Spectroscopy, Chemistry

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