Dr. James E. Carey
Founder at SiOnyx LLC
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 28 April 2021 Presentation + Paper
M. Pralle, C. Vineis, C. Palsule, J. Jiang, J. Carey
Proceedings Volume 11741, 117410E (2021) https://doi.org/10.1117/12.2588472

Proceedings Article | 20 May 2016 Paper
M. Pralle, C. Vineis, C. Palsule, J. Jiang, J. Carey
Proceedings Volume 9819, 981904 (2016) https://doi.org/10.1117/12.2223063
KEYWORDS: Quantum efficiency, Silicon, Near infrared, Sensors, CMOS sensors, Image sensors, Imaging systems, Infrared imaging, Infrared radiation, Metals

Proceedings Article | 5 October 2015 Presentation
Martin Pralle, James Carey, Thomas Joy, Chris Vineis, Chintamani Palsule
Proceedings Volume 9555, 95550D (2015) https://doi.org/10.1117/12.2190366
KEYWORDS: Near infrared, Silicon, Quantum efficiency, Absorption, Infrared imaging, Digital imaging, CMOS sensors, Laser applications, Standards development, Image processing

Proceedings Article | 26 May 2015 Paper
M. Pralle, J. Carey, C. Vineis, C. Palsule, J. Jiang, T. Joy
Proceedings Volume 9451, 945108 (2015) https://doi.org/10.1117/12.2177006
KEYWORDS: Silicon, Sensors, Infrared imaging, Cameras, Image sensors, Quantum efficiency, CMOS sensors, Infrared radiation, CCD image sensors, Imaging systems

Proceedings Article | 11 June 2013 Paper
M. Pralle, J. Carey, Homayoon Haddad, C. Vineis, J. Sickler, X. Li, J. Jiang, F. Sahebi, C. Palsule, J. McKee
Proceedings Volume 8704, 870407 (2013) https://doi.org/10.1117/12.2015959
KEYWORDS: Silicon, Sensors, Infrared radiation, Infrared imaging, CMOS sensors, Visible radiation, Image sensors, Charge-coupled devices, Quantum efficiency, Imaging systems

Proceedings Article | 23 May 2013 Paper
M. Pralle, J. Carey, H. Homayoon, J. Sickler, X. Li, J. Jiang, F. Sahebi, C. Palsule, J. McKee
Proceedings Volume 8734, 87340H (2013) https://doi.org/10.1117/12.2020291
KEYWORDS: Silicon, Infrared radiation, Sensors, Infrared imaging, Biometrics, Near infrared, CMOS sensors, Quantum efficiency, Iris recognition, Image processing

Proceedings Article | 31 May 2012 Paper
M. Pralle, J. Carey, H. Homayoon, J. Sickler, X. Li, J. Jiang, C. Hong, F. Sahebi, C. Palsule, J. McKee
Proceedings Volume 8353, 83533H (2012) https://doi.org/10.1117/12.919530
KEYWORDS: Silicon, Sensors, CMOS sensors, Infrared imaging, Image processing, Semiconductor lasers, Staring arrays, Ultrafast imaging, Infrared radiation, Standards development

Proceedings Article | 21 May 2011 Paper
M. Pralle, J. Carey, H. Homayoon, J. Sickler, X. Li, J. Jiang, D. Miller, C. Palsule, J. McKee
Proceedings Volume 8012, 801222 (2011) https://doi.org/10.1117/12.882867
KEYWORDS: Silicon, CMOS sensors, Quantum efficiency, Infrared imaging, Sensors, Semiconductor lasers, Laser processing, Charge-coupled devices, Manufacturing, Infrared lasers

Proceedings Article | 4 May 2010 Paper
M. Pralle, J. Carey, H. Homayoon, S. Alie, J. Sickler, X. Li, J. Jiang, D. Miller, C. Palsule, J. McKee
Proceedings Volume 7660, 76600N (2010) https://doi.org/10.1117/12.849683
KEYWORDS: Silicon, Quantum efficiency, Sensors, Photodetectors, Infrared imaging, Semiconductor lasers, CMOS sensors, Manufacturing, Infrared sensors, Infrared radiation

Proceedings Article | 26 August 2008 Paper
Richard Myers, Richard Farrell, Frank Robertson, James Carey, Eric Mazur
Proceedings Volume 7055, 70550L (2008) https://doi.org/10.1117/12.794866
KEYWORDS: Sensors, Avalanche photodetectors, Near infrared, Silicon, Quantum efficiency, Head, Semiconductor lasers, Photodiodes, Amplifiers, Avalanche photodiodes

SPIE Journal Paper | 1 February 2008
Ali Serpengüzel, Adnan Kurt, Ibrahim Inanc, James Cary, Eric Mazur
JNP, Vol. 2, Issue 01, 021770, (February 2008) https://doi.org/10.1117/12.10.1117/1.2896069
KEYWORDS: Silicon, Semiconductor lasers, Luminescence, Silicon photonics, Pulsed laser operation, Semiconducting wafers, Scanning electron microscopy, Femtosecond phenomena, Optical communications, Infrared radiation

Proceedings Article | 18 June 2004 Paper
Ali Serpenguzel, Temel Bilici, Ibrahim Inanc, Adnan Kurt, Jim Carey, Eric Mazur
Proceedings Volume 5349, (2004) https://doi.org/10.1117/12.529549
KEYWORDS: Silicon, Luminescence, Amorphous silicon, Atomic force microscopy, Temperature metrology, Semiconductor lasers, Physics, Crystals, Optical microcavities, Optoelectronics

Showing 5 of 12 publications
Conference Committee Involvement (10)
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XV
8 February 2015 | San Francisco, California, United States
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIV
2 February 2014 | San Francisco, California, United States
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII
3 February 2013 | San Francisco, California, United States
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XII
22 January 2012 | San Francisco, California, United States
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI
23 January 2011 | San Francisco, California, United States
Frontiers in Ultrafast Optics: Biomedical, Scientific and Industrial Applications X (Formerly: Commercial and Biomedical Applications of Ultrafast Lasers)
24 January 2010 | San Francisco, California, United States
Commercial and Biomedical Applications of Ultrafast Lasers IX
25 January 2009 | San Jose, California, United States
Commercial and Biomedical Applications of Ultrafast Lasers VIII
20 January 2008 | San Jose, California, United States
Commercial and Biomedical Applications of Ultrafast Lasers VII
21 January 2007 | San Jose, California, United States
Commercial and Biomedical Applications of Ultrafast Lasers VI
22 January 2006 | San Jose, California, United States
Showing 5 of 10 Conference Committees
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