Dr. Jeff Young Profile

Dr. Jeff Young

at Ansys Canada Ltd.

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Proceedings Article | 8 March 2024 Presentation + Paper

Source to detector simulation of quantum photonic integrated circuits

Sebastian Gitt, Jeff Young, Dylan McGuire

Proceedings Volume 12890, 1289008 (2024) https://doi.org/10.1117/12.3000548

KEYWORDS: Photons, Matrices, Quantum channels, Device simulation, Quantum simulation, Photonic integrated circuits, Resonators, Quantum squeezing, Quantum photonics, Directional couplers

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Quantum photonic devices are typically based on either discrete variable (DV) or continuous variable (CV) principles. In either case, their performance must meet strict “fidelity” requirements, especially when scaled using integrated photonic circuitry. DV devices must be robust to imperfections such as timing delays between photons, unwanted spectral correlations present in photons from nonideal single photon sources and variations in circuit components. Furthermore, it becomes increasingly important to have a methodology for characterizing the performance of devices in the presence of such errors. Here, we present a method for simulating quantum photonic integrated circuits (PICs) and use it to model the behavior of a circuit constructed to model the evolution of a quantum state subject to a Bose-Hubbard Hamiltonian, introducing variations to the coupling gaps in the directional couplers inside the circuit. Input states consisting of both indistinguishable and distinguishable photons are modelled. Compact models for the directional couplers and other photonic circuit elements that are parameterized for a specific fabrication process can be incorporated into the circuit using a foundry-associated compact model library, ensuring consistency between circuit design and manufactured component. In CV applications, the degree of squeezing provided by some nonlinear element is often a key metric. Here we describe how the degree of squeezing produced by spontaneous four-wave mixing (SFWM) in a microring resonator can be modelled in the low-power limit, accounting for the effects of self-phase modulation (SPM), cross-phase modulation (XPM), and component losses.

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