Dr. Jonathan O. Tollerud
Beamline Scientist at Swinburne Univ of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 March 2020 Presentation
Stuart Earl, Mitchell Conway, Jack Muir, Jonathan Tollerud, Jeffrey Davis
Proceedings Volume 11278, 112781D (2020) https://doi.org/10.1117/12.2547180
KEYWORDS: Transition metals, Ultrafast phenomena, Semiconductors, Ultrafast laser spectroscopy, Spectroscopy

Proceedings Article | 6 December 2010 Paper
Carmen Menoni, Erik Krous, Dinesh Patel, Peter Langston, Jonathan Tollerud, Duy Nguyen, Luke Emmert, Ashot Markosyan, Roger Route, Martin Fejer, Wolfgang Rudolph
Proceedings Volume 7842, 784202 (2010) https://doi.org/10.1117/12.855604
KEYWORDS: Laser induced damage, Ion beams, Sputter deposition, Oxygen, Scandium, Picosecond phenomena, Refractive index, Atomic force microscopy, Argon, Optical coatings

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top