Dr. Kolli Narasimha Rao Profile

Dr. Kolli Narasimha Rao

Principal Research Scientist at Indian Institute of Science

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 29 August 2008 Paper

Some studies on TiO2 films deposited by sol-gel technique

K. Narasimha Rao, M. Vishwas, Sudhir Kumar Sharma, K. V. Arjuna Gowda

Proceedings Volume 7067, 70670F (2008) https://doi.org/10.1117/12.799923

KEYWORDS: Annealing, Refractive index, Sol-gels, Thin films, Scanning electron microscopy, Coating, Titanium, Glasses, Thin film coatings, Titanium dioxide

Read Abstract +

SPIE Journal Paper | 1 November 2002

Preparation of transparent conducting oxide films by activated reactive evaporation

K. Rao

OE, Vol. 41, Issue 11, (November 2002) https://doi.org/10.1117/12.10.1117/1.1513798

KEYWORDS: Oxides, Oxygen, Transmittance, Transparent conducting films, Resistance, Absorption, Tin, Ions, Transparent conducting oxide, Reflectivity

SPIE Journal Paper | 1 September 2002

Influence of deposition parameters on optical properties of TiO2 films

K. Rao

OE, Vol. 41, Issue 09, (September 2002) https://doi.org/10.1117/12.10.1117/1.1496489

KEYWORDS: Oxygen, Transmittance, Refractive index, Titanium, Absorption, Optical properties, Electron beams, Temperature metrology, Reflectivity, Titanium dioxide

SPIE Journal Paper | 1 June 2000

Method for measurement of the angles of a 45-deg deflecting (half penta) prism

S. Rao, K. Rao

OE, Vol. 39, Issue 06, (June 2000) https://doi.org/10.1117/12.10.1117/1.602531

KEYWORDS: Prisms, Autocollimators, Polishing, Spectrometers, Optical engineering, Surface finishing, Optical components, Distance measurement, Optical instrument design, Instrumentation engineering

SPIE Journal Paper | 1 April 1998

Method for measurement of the angles of a penta prism

S. Rao, K. Rao

OE, Vol. 37, Issue 04, (April 1998) https://doi.org/10.1117/12.10.1117/1.601899

KEYWORDS: Prisms, Surface finishing, Autocollimators, Error analysis, Polishing, Spectrometers, Metrology, Solids, Autocollimation, Instrumentation engineering

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years