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Kun Cui
at Shanghai Institute of Technical Physics CAS
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Publications (1)
Proceedings Article | 3 November 2016 Paper
A high-speed and low-noise intelligent test system for infrared detectors
Tianshi Jia, Yulong Xue, Kun Cui, Fansheng Kong
Proceedings Volume 10030, 100301E (2016) https://doi.org/10.1117/12.2246425
KEYWORDS: Infrared detectors, Intelligence systems, Infrared radiation, Infrared technology, Sensors, Infrared imaging, Signal detection, Data acquisition, Data acquisition boards, Amplifiers
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