Dr. Martin Weiss
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 April 2023 Presentation + Paper
Proceedings Volume 12496, 1249603 (2023) https://doi.org/10.1117/12.2664960
KEYWORDS: Printing, Reticles, Scanners, Overlay metrology, Extreme ultraviolet lithography, Extreme ultraviolet, Semiconducting wafers, Lithography, Photomasks, Optical lithography

Proceedings Article | 10 January 1996 Paper
Martin Weiss, Ramakant Srivastava, Howard Groger
Proceedings Volume 2695, (1996) https://doi.org/10.1117/12.229972
KEYWORDS: Refractive index, Waveguides, Surface plasmons, Metals, Water, Wave propagation, Waveguide sensors, Polarization, Structural sensing, Dielectrics

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top