Nan-Jung Hsu
at National Tsing Hua Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 April 2023 Poster + Paper
Tung-Yu Hsiao, Nan-Jung Hsu, Stefano Sfarra, Yuan Yao
Proceedings Volume 12489, 124890J (2023) https://doi.org/10.1117/12.2657667
KEYWORDS: Defect detection, Thermography, Data processing, Nondestructive evaluation, Statistical analysis, Image processing, Data modeling, Background noise

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