Dr. Nan Fu
Member of Technical Staff at GLOBALFOUNDRIES Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 October 2016 Paper
Proceedings Volume 9985, 998527 (2016) https://doi.org/10.1117/12.2240934
KEYWORDS: Optical proximity correction, Optical properties, Algorithm development, Optical alignment, Geometrical optics, Wafer-level optics, Computer simulations, Semiconducting wafers, Photomasks, Lithography

Proceedings Article | 23 October 2015 Paper
Nan Fu, Guoxiang Ning, Florian Werle, Stefan Roling, Sandra Hecker, Paul Ackmann, Christian Buergel
Proceedings Volume 9635, 96351H (2015) https://doi.org/10.1117/12.2197195
KEYWORDS: Reticles, Semiconducting wafers, Optical proximity correction, Logic, Lithography, Photomasks, Data modeling, Tolerancing, Critical dimension metrology, Silicon

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