Dr. Nicolas Passilly
Chargé de Recherche at FEMTO-ST
SPIE Involvement:
Author
Websites:
Publications (29)


Proceedings Article | 10 June 2024 Poster + Paper
Simon Ans, Guillaume Demésy, Frédéric Zamkotsian, Andrei Mursa, Roland Salut, Nicolas Passilly
Proceedings Volume 12990, 129900K (2024) https://doi.org/10.1117/12.3016915
KEYWORDS: Diffraction, Blazed gratings, Manufacturing, Diffraction gratings, Etching, Design, Nonlinear optimization

Proceedings Article | 1 March 2019 Presentation + Paper
Proceedings Volume 10934, 109342F (2019) https://doi.org/10.1117/12.2506225
KEYWORDS: Cesium, Glasses, Clocks, Atomic clocks, Silicon, Semiconducting wafers, Microfabrication, Neon, Vertical cavity surface emitting lasers, Metrology

Proceedings Article | 7 September 2018 Paper
Proceedings Volume 10834, 108340M (2018) https://doi.org/10.1117/12.2319084
KEYWORDS: Microelectromechanical systems, Optical coherence tomography, Microopto electromechanical systems, Interferometry, Mirau interferometers, Scanners, Objectives, GRIN lenses, Glasses, Endomicroscopy

Proceedings Article | 24 May 2018 Paper
C. Gorecki, J. Vincente Carrion, N. Passilly, S. Bargiel
Proceedings Volume 10678, 1067814 (2018) https://doi.org/10.1117/12.2311305
KEYWORDS: Axicons, Glasses, Bessel beams, Silicon, Semiconducting wafers, Microfabrication, Micromachining, Wafer bonding, Fabrication, Microlens

Proceedings Article | 24 May 2018 Presentation + Paper
Proceedings Volume 10678, 1067807 (2018) https://doi.org/10.1117/12.2311298
KEYWORDS: Microopto electromechanical systems, Optical coherence tomography, Scanners, Micromirrors, Stomach, Microelectromechanical systems, Glasses, Endomicroscopy, Cancer, GRIN lenses

Proceedings Article | 27 April 2016 Paper
Proceedings Volume 9888, 98880T (2016) https://doi.org/10.1117/12.2228833
KEYWORDS: Optical components, Polishing, Micro optics, Glasses, Optical aberrations, Semiconducting wafers, Microlens

Proceedings Article | 26 April 2016 Paper
Proceedings Volume 9890, 98900C (2016) https://doi.org/10.1117/12.2229477
KEYWORDS: Skin, Microopto electromechanical systems, Optical coherence tomography, Microsystems, Mirrors, Silicon, Semiconducting wafers, Beam splitters

Proceedings Article | 26 April 2016 Paper
Proceedings Volume 9890, 98901A (2016) https://doi.org/10.1117/12.2228847
KEYWORDS: Wavefronts, Phase retrieval, Microlens, Interferometry, Micro optics, Metrology, Optical components, Optical properties, Optical aberrations, Imaging systems, Digital holography, Microscopes, Objectives, Wave propagation

Proceedings Article | 26 April 2016 Paper
Wei-Shan Wang, Maik Wiemer, Joerg Froemel, Tom Enderlein, Thomas Gessner, Justine Lullin, Sylwester Bargiel, Nicolas Passilly, Jorge Albero, Christophe Gorecki
Proceedings Volume 9890, 989011 (2016) https://doi.org/10.1117/12.2229884
KEYWORDS: Semiconducting wafers, Interferometers, Microelectromechanical systems, Microlens, Mirau interferometers, Wafer bonding, Microopto electromechanical systems, Optical coherence tomography, Scanners, Beam splitters, Laser cutting, Gold, Glasses

Proceedings Article | 26 April 2016 Paper
Proceedings Volume 9890, 98900D (2016) https://doi.org/10.1117/12.2230487
KEYWORDS: Micromirrors, Silicon, Interferometry, Optical coherence tomography, Phase shifts, Microopto electromechanical systems, Microactuators, Phase shifting, Mirau interferometers, Semiconducting wafers, Photomasks, Etching

Proceedings Article | 1 September 2015 Paper
Proceedings Volume 9576, 957609 (2015) https://doi.org/10.1117/12.2189885
KEYWORDS: Optical coherence tomography, Mirrors, Sensors, Light sources, Cameras, Imaging systems, Objectives, Signal processing, Optical imaging, Beam splitters

Proceedings Article | 22 June 2015 Paper
Proceedings Volume 9529, 952913 (2015) https://doi.org/10.1117/12.2189278
KEYWORDS: Optical coherence tomography, Cameras, Phase shifts, Mirrors, Light sources, Signal to noise ratio, Skin cancer, Molybdenum, Interferometers, Phase shifting

Proceedings Article | 27 February 2015 Paper
S. Bargiel, M. Baranski, N. Passilly, C. Gorecki, M. Wiemer, J. Frömel, D. Wünsch, W. Wang
Proceedings Volume 9375, 93750L (2015) https://doi.org/10.1117/12.2078007
KEYWORDS: Glasses, Silicon, Microlens, Semiconducting wafers, Wafer-level optics, Confocal microscopy, Etching, Microscopes, Microopto electromechanical systems, Beam splitters

Proceedings Article | 27 February 2015 Paper
Wei-Shan Wang, Justine Lullin, Joerg Froemel, Maik Wiemer, Sylwester Bargiel, Nicolas Passilly, Christophe Gorecki, Thomas Gessner
Proceedings Volume 9375, 93750P (2015) https://doi.org/10.1117/12.2077641
KEYWORDS: Semiconducting wafers, Wafer bonding, Interfaces, Mirau interferometers, Microopto electromechanical systems, Microlens, Glasses, Silicon, Optical coherence tomography, Wafer-level optics

Proceedings Article | 18 August 2014 Paper
Proceedings Volume 9204, 92040D (2014) https://doi.org/10.1117/12.2061299
KEYWORDS: Microlens, Modulation transfer functions, Imaging systems, Optical components, Microscopes, Objectives, Molybdenum, Wavefronts, 3D metrology, Etching

Proceedings Article | 2 May 2014 Paper
Proceedings Volume 9130, 91300U (2014) https://doi.org/10.1117/12.2051043
KEYWORDS: Glasses, Microlens, Silicon, Lenses, Inspection, Semiconducting wafers, Fabrication, Matrices, Microlens array, Deep reactive ion etching

Proceedings Article | 1 May 2014 Paper
Proceedings Volume 9132, 91320L (2014) https://doi.org/10.1117/12.2054573
KEYWORDS: Optical coherence tomography, Interferometers, Optical design, Skin, Beam splitters, Sensors, Cameras, Imaging systems, Electroluminescent displays, Tissue optics

Proceedings Article | 1 May 2014 Paper
Proceedings Volume 9132, 913216 (2014) https://doi.org/10.1117/12.2051122
KEYWORDS: 3D metrology, Optical components, Objectives, Imaging systems, Point spread functions, Microscopes, Cameras, Microlens, CMOS cameras, High dynamic range imaging

Proceedings Article | 13 March 2013 Paper
S. Bargiel, C. Gorecki, M. Barański, N. Passilly, M. Wiemer, C. Jia, J. Frömel
Proceedings Volume 8616, 861605 (2013) https://doi.org/10.1117/12.2002422
KEYWORDS: Microlens, Glasses, Silicon, Semiconducting wafers, 3D scanning, Wafer bonding, Scanners, Microactuators, Microscopes, Ceramics

Proceedings Article | 13 September 2012 Paper
Proceedings Volume 8494, 849403 (2012) https://doi.org/10.1117/12.932226
KEYWORDS: Semiconducting wafers, Microelectromechanical systems, Mirau interferometers, Interferometry, Glasses, Microlens, Interferometers, Micromirrors, Beam splitters, Inspection

Proceedings Article | 9 May 2012 Paper
Proceedings Volume 8428, 84281G (2012) https://doi.org/10.1117/12.921875
KEYWORDS: Microlens, Etching, Silicon, Microlens array, Lenses, Wet etching, Spherical lenses, Semiconducting wafers, Matrices, Chemical elements

Proceedings Article | 7 September 2011 Paper
Emmanuel Cagniot, Michael Fromager, Thomas Godin, Nicolas Passilly, Marc Brunel, Kamel Aït-Ameur
Proceedings Volume 8130, 813006 (2011) https://doi.org/10.1117/12.892146
KEYWORDS: Mirrors, Resonators, Crystals, Beam shaping, Lithium, Diffractive optical elements, Laser resonators, Lenses, Optimization (mathematics), Beam propagation method

Proceedings Article | 24 August 2009 Paper
K. Aït-Ameur, N. Passilly, M. Fromager, E. Cagniot
Proceedings Volume 7430, 74300P (2009) https://doi.org/10.1117/12.828143
KEYWORDS: Diffractive optical elements, Transmission electron microscopy, Polarization, Binary data, Beam propagation method, Diffraction, Beam shaping, Mirrors, Phase shifts, Gaussian beams

Proceedings Article | 14 May 2008 Paper
Y. Jourlin, Y. Bourgin, S. Reynaud, O. Parriaux, A. Talneau, P. Karvinen, N. Passilly, A. Md. Zain, R. De La Rue
Proceedings Volume 6992, 69920C (2008) https://doi.org/10.1117/12.783390
KEYWORDS: Photomasks, Refractive index, Microelectronics, Silicon, Printing, Water, Etching, Deep ultraviolet, Diffraction, Lithography

Proceedings Article | 9 June 2006 Paper
N. Passilly, M. Fromager, K. Aït-Ameur
Proceedings Volume 6054, 60540R (2006) https://doi.org/10.1117/12.660811
KEYWORDS: Mirrors, Pulsed laser operation, Rod lasers, Diffraction, Diffractive optical elements, Refractive index, Ions, Laser applications, Laser resonators, Q switches

Proceedings Article | 1 September 2004 Paper
Nicolas Passilly, Michael Fromager, Kamel Ait-Ameur, Richard Moncorge, Jean-Louis Doualan, Antoine Hirth, Greg Quarles
Proceedings Volume 5460, (2004) https://doi.org/10.1117/12.545009
KEYWORDS: Refractive index, Ions, Rod lasers, Chromium, Mirrors, Polarizability, Pulsed laser operation, Oscillators, Diagnostics, Photodiodes

Proceedings Article | 1 September 2004 Paper
Nicolas Passilly, Laurence Mechin, Chantal Gunther, Kamel Ait-Ameur
Proceedings Volume 5456, (2004) https://doi.org/10.1117/12.545101
KEYWORDS: Gaussian beams, Beam shaping, Diffraction, Diffractive optical elements, Near field, Laser components, Glasses, Phase shifting, Binary data, Annealing

Proceedings Article | 1 September 2004 Paper
Proceedings Volume 5456, (2004) https://doi.org/10.1117/12.545040
KEYWORDS: Laser beam propagation, Beam propagation method, Gaussian beams, Optical components, Laser applications, Superposition, Ion lasers, High power lasers, Resonators, Two wave mixing

Showing 5 of 29 publications
Conference Committee Involvement (5)
Optics and Photonics for Advanced Dimensional Metrology II
5 April 2022 | Strasbourg, France
Optics and Photonics for Advanced Dimensional Metrology
6 April 2020 | Online Only, France
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Optical Micro- and Nanometrology
5 April 2016 | Brussels, Belgium
Optical Micro- and Nanometrology
15 April 2014 | Brussels, Belgium
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