Mr. Peter M. Allenspach Profile

Peter M. Allenspach

at ETH Zurich

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 8 November 2001 Paper

Loss mechanisms in supermirror neutron guides

Peter Allenspach, Peter Boeni, Kim Lefmann

Proceedings Volume 4509, (2001) https://doi.org/10.1117/12.448070

KEYWORDS: Reflectivity, Coating, Glasses, Monte Carlo methods, Tolerancing, Reflection, Scattering, Manufacturing, Chemical elements, Boron

Read Abstract +

Supermirror neutron guides have become a standard solution to transport neutrons from the source to the instruments. The performance of the guides depends strongly on the reflectivity of the coating, the waviness of the substrate, and the alignment of the guide elements. We have performed Monte Carlo simulations in order to quantify these influences for non-perfect, real neutron guides and to compare the importance of the different loss mechanisms. The importance of a good reflectivity was demonstrated in previous publications and is supported by our investigations. We show that the waviness of the substrate can easily be compensated by increasing the critical angle of reflection without degrading the divergence of the outgoing neutron beam. For geometrical imperfections such as off-sets of the individual guide elements or deviations from an exact rectangular guide cross section, the degradation of the neutron flux at the end of a neutron guide corresponds roughly to the proportion of the cross section affected by these imperfections to the total guide cross section.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years