Mr. Peter Flug Profile

Peter Flug

President at Xonox Technology GmbH

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Proceedings Article | 28 October 2021 Presentation + Paper

Enabling streamlined quality control with XONOX IQC

Frank DeWitt, Peter Flug

Proceedings Volume 11889, 1188910 (2021) https://doi.org/10.1117/12.2603289

KEYWORDS: Inspection, Interferometers, Tolerancing, Optical spheres, Optical components, Process control, Optics manufacturing, Assembly tolerances, Metrology, Quality systems

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Quality Control requires the measurement of all dimensions and specifications for which a supplier is contractually bound to deliver but does not add intrinsic value to the parts that are to be inspected. Therefore, streamlining QC activities provides important savings by reducing overhead costs. QC activities aid in process development, and when combined with Statistical Process Control (SPC) methods, can alert users to trends that would result in products failing specifications before those failures occur. In addition, the ability to collect and analyze a comprehensive data set consisting of the as manufactured, measured values for the parameters of interest can be utilized by system integrators. To serve the needs of the optical manufacturing community and system integrators alike, XONOX has developed an integrated system that allows lens manufacturers and lens consumers to efficiently check all aspects of traditional lens elements. Through the use of innovative job planning and reporting software, devices designed for efficient series inspection, and a process that ensures traceability and consistency, XONOX IQC provides a turn-key solution that meets demanding production, inspection and regulatory requirements.

Proceedings Article | 18 June 2007 Paper

Reaching lambda/100 resolution in static fringes interferometry using linear prediction

Manuel Mestre, Didier Pasquelin, Peter Flug

Proceedings Volume 6616, 661610 (2007) https://doi.org/10.1117/12.726037

KEYWORDS: Wavefronts, Photovoltaics, Reconstruction algorithms, Interferometry, Interferometers, Metrology, Phase shifts, Monte Carlo methods, Fringe analysis, Turbulence

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Both in industrial close-to-production quality control and in laboratory metrology, measuring optical components and systems with high precision and resolution (typically lambda/100 ptv) is currently achieved by phase-shifting interferometry devices. The main drawbacks of such devices compared to static fringes systems lie in a higher cost, and a greater the sensitivity to the environment, both vibration and air turbulence; the latter becomes unacceptable for large components and large cavity interferometers. Conversely, static fringes metrology usually lacks precision and resolution. Particularly, the lateral resolution is an issue, due to the sampling theorem. This paper shows how a linear prediction of a random function (with a Bayesian approach) makes it possible to tackle a lambda/100 resolution for the estimated wavefront, being the mathematical expectation of the prediction, i.e. the most probable form with respect to the fringe data. Incidentally, the prediction increases robustness by detecting and correcting aberrant fringe data with a high reliability. Furthermore, a Monte-Carlo simulation performed on the whole conditional probability density of the wavefront, provides a stochastic sub-fringe-spacing interpolation. As a result, confidence intervals for any parameter of interest (such as ptv, rms, ptv of slopes...) can be estimated over the whole aperture, which is novel worldwide. These algorithms have also been adapted to wavefront reconstruction from gradient data for Shack-Hartmann and for moiré devices. Examples of implementing these algorithms to industrial software will be shown.

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