Prof. Richard K. Leach
Professor at Univ of Nottingham
SPIE Involvement:
Author | Editor
Publications (32)

SPIE Journal Paper | 12 April 2024 Open Access
OE, Vol. 63, Issue 04, 044102, (April 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.4.044102
KEYWORDS: 3D modeling, Optical surfaces, Instrument modeling, Modeling, Equipment, Light sources and illumination, Optical engineering, Interferometry, Imaging systems, 3D metrology

Proceedings Article | 4 October 2023 Poster + Paper
M. Sosin, J. Gonzalez Cobas, M. Isa, R. Leach, H. Mainaud Durand
Proceedings Volume 12684, 126840C (2023) https://doi.org/10.1117/12.2674132
KEYWORDS: Distance measurement, Analog to digital converters, Gas cells, Laser frequency, Interferometers, Signal detection, Photodetectors, Measurement uncertainty, Interpolation

Proceedings Article | 11 August 2023 Paper
Proceedings Volume 12623, 126230C (2023) https://doi.org/10.1117/12.2673088
KEYWORDS: Accuracy assessment, Robots, Robotics, Binocular vision, Optical spheres, Metrology, Robotic systems, Interferometers, Target detection, Actuators

Proceedings Article | 10 August 2023 Presentation + Paper
Proceedings Volume 12619, 126190R (2023) https://doi.org/10.1117/12.2673657
KEYWORDS: 3D modeling, Optical surfaces, Modeling, Equipment, Instrument modeling, Light sources and illumination, Interferometry, Imaging systems, Fourier transforms

SPIE Journal Paper | 31 December 2022
OE, Vol. 61, Issue 12, 124113, (December 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.12.124113
KEYWORDS: Light scattering, Optical surfaces, Scattering, 3D modeling, Optical engineering, Multiple scattering, Modeling, Data modeling, Polarization, Confocal microscopy

Showing 5 of 32 publications
Proceedings Volume Editor (2)

SPIE Conference Volume | 31 May 2022

SPIE Conference Volume | 16 April 2020

Conference Committee Involvement (9)
Optical Measurement Systems for Industrial Inspection XIII
26 June 2023 | Munich, Germany
Optics and Photonics for Advanced Dimensional Metrology II
5 April 2022 | Strasbourg, France
Optical Instrument Science, Technology, and Applications II
13 September 2021 | Online Only, Spain
Applied Optical Metrology IV
4 August 2021 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Showing 5 of 9 Conference Committees
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