We present radiometric calibration methods and data for a HgCdTe longwave IR focal plane array camera that will be used for nonuniformity correction and calibration of an ambient-background IR scene projector at the Johns Hopkins University Applied Physics Laboratory. Reported results include spectral response, responsivity (in terms of radiance), and non-radiometric measurements important in the IRSP NUC process. Uncertainty sources and estimates are discussed as they apply to this problem. We found that a responsivity measurement should be performed each time the camera is powered on, and that drift in the output signal stabilizes within about an hour. Even after waiting an hour, it may be necessary to measure a blackbody source periodically during IRSP calibration to ensure that camera drift does not skew the results.
The Guidance System Evaluation Laboratory of The Johns Hopkins University Applied Physics Laboratory developed a hardware-in-the-loop (HWIL) simulation facility in 2000 for the test and evaluation of the Aegis Ballistic Missile Defense Standard Missile-3 (SM-3) kinetic warhead. We continue to expand on this architecture to facilitate the test of the tactically deployed SM-3 system. An overview and philosophy of the HWIL facility is described. Each of the key test equipment devices is described, along with an upgrade path that provides more accuracy and reliability, as well as increased test capability. The key components are the body dynamics simulation control computer, a scene rendering computer, a resistive-array IR scene projector, and support optics.
Absolute radiometric calibration, measurement and error analysis techniques are described for IR imaging radiometers as they apply to field measurements. A serial scanning type system previously used for relative (contrast) measurements is presented as an example in illustrating the techniques. Error sources that are unique to the absolute measurement problem are highlighted. Two field measurement examples are presented to illustrate how the individual error terms can vary and affect the overall measurement accuracy.
Conference Committee Involvement (5)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
7 April 2010 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
13 April 2009 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
17 March 2008 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
10 April 2007 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
18 April 2006 | Orlando (Kissimmee), Florida, United States
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