Dr. Roman Antos Profile

Dr. Roman Antos

Researcher at Charles Univ

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Publications (7)

Proceedings Article | 18 May 2011 Paper

Complex Fourier factorization techniques in calculation of modes of discontinuous optical structures with an arbitrary cross-section

Roman Antos, Martin Veis

Proceedings Volume 8070, 807009 (2011) https://doi.org/10.1117/12.889264

KEYWORDS: Polarization, Performance modeling, Europium, Photonic crystals, Statistical modeling, Matrices, Holmium, Diffraction gratings, Maxwell's equations, Optical components

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Proceedings Article | 12 May 2009 Paper

Complex Fourier factorization method applied in modeling optical metamaterials based on 2D periodic nanostructures

Roman Antos, Martin Veis, Stefan Visnovsky

Proceedings Volume 7353, 73531C (2009) https://doi.org/10.1117/12.826859

KEYWORDS: Polarization, Diffraction, Quartz, Silicon, Diffraction gratings, Matrices, Gold, Optical metamaterials, Nanostructures, Reflectivity

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Proceedings Article | 12 April 2007 Paper

Characteristic matrix of anisotropic coupling gap

Jaromír Pištora, Jaroslav Vlček, Roman Antoš, Tomuo Yamaguchi, Kamil Postava, Ondřej Bárta

Proceedings Volume 6609, 660908 (2007) https://doi.org/10.1117/12.739371

KEYWORDS: Prisms, Polarization, Liquids, Magnetism, Reflectivity, Anisotropy, Refractive index, Matrices, Interfaces, Waveguides

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Proceedings Article | 2 February 2007 Paper

Observation of coupled magnetic vortex structure dynamics by time-resolved magneto-optical Kerr effect microscopy

Roman Antos, Jaroslav Hamrle, Hiroaki Masaki, Takashi Kimura, Junya Shibata, Yoshichika Otani

Proceedings Volume 6479, 647907 (2007) https://doi.org/10.1117/12.696264

KEYWORDS: Magnetism, Microscopy, Objectives, Fourier transforms, Kerr effect, Crystals, Microscopes, Semiconductor lasers, CCD cameras, Analytical research

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Proceedings Article | 20 October 2005 Paper

Optical metrology of binary arrays of holes in semiconductor media using microspot spectroscopic ellipsometry

Roman Antos, Ivan Ohlidal, Jan Mistrik, Tomuo Yamaguchi, Stefan Visnovsky, Shinji Yamaguchi, Masahiro Horie

Proceedings Volume 5965, 59652B (2005) https://doi.org/10.1117/12.624837

KEYWORDS: Scanning electron microscopy, Silicon, Spectroscopic ellipsometry, Semiconducting wafers, Diffraction gratings, Binary data, Diffraction, Scatterometry, Optical metrology, Optical lithography

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Proceedings Article | 27 August 2005 Paper

Airy-like internal reflection series applied in scatterometry and simulations of gratings

Roman Antos, Jan Mistrik, Tomuo Yamaguchi, Masahiro Horie, Stefan Visnovsky

Proceedings Volume 5858, 58580Y (2005) https://doi.org/10.1117/12.612496

KEYWORDS: Magnetism, Diffraction gratings, Diffraction, Polarization, Tantalum, Algorithms, Silicon, Solids, Semiconductors, Scatterometry

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Proceedings Article | 10 May 2005 Paper

Optical metrology of patterned magnetic structures: deep versus shallow gratings

Roman Antos, Martin Veis, Eva Liskova, Mitsuru Aoyama, Jaroslav Hamrle, Takashi Kimura, Pavol Gustafik, Masahiro Horie, Jan Mistrik, Tomuo Yamaguchi, Stefan Visnovsky, Naomichi Okamoto

Proceedings Volume 5752, (2005) https://doi.org/10.1117/12.599653

KEYWORDS: Diffraction, Chromium, Silicon, Molybdenum, Nickel, Magnetism, Spectroscopy, Diffraction gratings, Atomic force microscopy, Oxides

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Showing 5 of 7 publications

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