Rony Jose James
at Ctr Suisse d'Electronique et de Microtechnique SA
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 March 2021 Presentation
Proceedings Volume 11692, 116920Q (2021) https://doi.org/10.1117/12.2578669
KEYWORDS: Semiconducting wafers, Ultraviolet radiation, Silicon carbide, Microlens, Wafer-level optics, Wafer bonding, Transparency, Thermography, Structured optical fibers, Standards development

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