Prof. Suk In Yoo Profile

Prof. Suk In Yoo

at Seoul National Univ

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Author

Publications (10)

Proceedings Article | 17 March 2017 Paper

Spatial kernel bandwidth estimation in background modeling

In Jeon, Suk Yoo

Proceedings Volume 10341, 103412D (2017) https://doi.org/10.1117/12.2268512

KEYWORDS: Computer science, Organic light emitting diodes, Defect detection, Inspection, Data modeling, Data analysis, Statistical modeling, Motion models, Visual process modeling, Fuzzy logic

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SPIE Journal Paper | 14 September 2012

Defect detection on images using multiple reference images: solving a binary labeling problem using graph-cuts algorithm

Janghee Lee, Suk In Yoo

JEI, Vol. 21, Issue 3, 033014, (September 2012) https://doi.org/10.1117/12.10.1117/1.JEI.21.3.033014

KEYWORDS: Defect detection, Binary data, Detection and tracking algorithms, Semiconducting wafers, Scanning electron microscopy, Image processing, Inspection, Optimization (mathematics), Image analysis, Expectation maximization algorithms

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Proceedings Article | 6 May 2010 Paper

A hybrid energy model for extracting boundaries of multiple overlapped objects on images

Janghee Lee, Suk I. Yoo

Proceedings Volume 7723, 77231L (2010) https://doi.org/10.1117/12.854125

KEYWORDS: Image segmentation, Statistical modeling, Scanning electron microscopy, Semiconducting wafers, Feature extraction, Data modeling, Image processing, Computer science, Computer engineering, Image processing algorithms and systems

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SPIE Journal Paper | 1 July 2008

Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception

No-Kap Park, Suk In Yoo

JEI, Vol. 17, Issue 03, 031107, (July 2008) https://doi.org/10.1117/12.10.1117/1.2957879

KEYWORDS: Visibility, Visualization, Thin films, Transistors, Inspection, Defect detection, Detection and tracking algorithms, Liquid crystals, LCDs, Feature extraction

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Proceedings Article | 26 February 2008 Paper

Non referential method for defects inspection of TFT-LCD pad

Hye Won Kim, Suk In Yoo

Proceedings Volume 6813, 68130V (2008) https://doi.org/10.1117/12.766075

KEYWORDS: Defect detection, Inspection, Defect inspection, Array processing, Image segmentation, Process control, Signal detection, Image processing, Sensors, Thin films

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Proceedings Article | 26 February 2008 Paper

Directional filter banks for detecting un-patterned TFT-LCD defect

No Kap Park, Hye Won Kim, Suk In Yoo

Proceedings Volume 6813, 68130U (2008) https://doi.org/10.1117/12.766182

KEYWORDS: Sensors, Defect detection, Edge detection, Manufacturing, Image filtering, Image processing, Detection and tracking algorithms, Image segmentation, LCDs, Eye

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Proceedings Article | 18 January 2006 Paper

Quantification of line mura defect levels based on multiple characterizing features

No K. Park, Kyu N. Choi, Suk I. Yoo

Proceedings Volume 6066, 606603 (2006) https://doi.org/10.1117/12.642828

KEYWORDS: Visibility, Optical inspection, Inspection, Visualization, Manufacturing, Distance measurement, Visual process modeling, Detection and tracking algorithms, Complex systems, Computer engineering

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Proceedings Article | 19 April 2004 Paper

Area-mura detection in TFT-LCD panel

Kyu Choi, Jae Lee, Suk Yoo

Proceedings Volume 5300, (2004) https://doi.org/10.1117/12.525557

KEYWORDS: Image segmentation, Distortion, Image filtering, Image processing, Diagnostics, Digital filtering, Manufacturing, Electronics, Defect detection, Printed circuit board testing

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Proceedings Article | 4 April 2001 Paper

Applying neural network to combining the heterogeneous features in content-based image retrieval

HyoungGu Lee, Suk In Yoo

Proceedings Volume 4305, (2001) https://doi.org/10.1117/12.420929

KEYWORDS: Image retrieval, Feature extraction, Databases, Content based image retrieval, Neural networks, Computing systems, Human-computer interaction, Visualization, Image processing, Distance measurement

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Proceedings Article | 11 October 2000 Paper

Nonlinear combining of heterogeneous features in content-based image retrieval

HyoungGu Lee, Suk In Yoo

Proceedings Volume 4197, (2000) https://doi.org/10.1117/12.403774

KEYWORDS: Image retrieval, Feature extraction, Databases, Content based image retrieval, Neural networks, Computing systems, Human-computer interaction, Data modeling, Video, Matrices

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Showing 5 of 10 publications

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